9, November 2020

ESA Open Invitation to Tender AO10536
Open Date: 03/11/2020
Closing Date: 15/12/2020 13:00:00

Status: ISSUED
Reference Nr.: 20.1ED.10
Prog. Ref.: GSTP Element 1 Dev
Budget Ref.: E/0904-611 – GSTP Element 1 Dev
Special Prov.: DE
Tender Type: C
Price Range: > 500 KEURO
Products: Launchers / Electronics / EEE Components / Capacitors / Satellites & Probes / Electronics / EEE Components / Capacitors
Technology Domains: EEE Components and Quality / Methods and Processes for Product Assurance of EEE Components, including Radiation Hardness Assurance / Evaluation and Testing / Quality, Dependability and Safety / Product and Quality Assurance / Product Assurance Processes for Flight and Ground Systems
Establishment: ESTEC
Directorate: Directorate of Tech, Eng. & Quality
Department: Electrical Department
Division: Data Syst & Microelectronics Division
Contract Officer: Erkelens-Sickinger, Franziska
Industrial Policy Measure: N/A – Not apply
Last Update Date: 03/11/2020
Update Reason: Tender issue

Industry is at very fast pace increasing the number of commercial components (COTS), mainly for cost reasons but also for performance, mass/volume etc. More and more often board or unit level testing is suggested instead of classical component level set-up. Whilethis may be very useful the space community does not yet have access to information about the effectiveness of the new test regime,neither to any vast information on commercial components reliability when used in space application. Thus, the aim is to investigate the effectiveness of board/unit level testing compared to traditional EEE level where a test vehicle should be extensively tested for reliability, infant mortality and radiation and the results compared to corresponding tests performed at EEE level, along with along with the preparation of recommendations for board/unit level testing and to collect large amount of test data on commercial components. For this, several tasks need to be achieved: Procure a number of commercial component batches from different families (may be standard and RF microcircuits and discrete, photonics and passives), preferably of automotive grade, and assess the degree ofinformation and traceability available. An existing product is preferred and the feasibility of the test vehicle shall be presentedtogether with supporting documentation (declared component and material lists, design description, part stress analysis as a minimum). Perform tests on component as well as board/unit level and compare the results, which shall cover both reliability and radiation.Assess the benefits of test methods previously not used for space like HASS and HALT, where comparison between the two test methodologies shall be done and the results used to propose guidelines for unit level testing as alternative to component testing forscreening, lot acceptance and total dose radiation.

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